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Scanning Electron Microscopy and X-Ray Microanalysis

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Scanning Electron Microscopy and X-Ray Microanalysis

Автор

Eric Lifshin

,

Patrick Echlin

,

Dale E. Newbury

,

Charles E. Lyman

,

Linda Sawyer

,

J.r. Michael

,

David C. Joy

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
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