Scanning Electron Microscopy and X-Ray Microanalysis
Автор
Eric Lifshin
, Patrick Echlin
, Dale E. Newbury
, Charles E. Lyman
, Linda Sawyer
, J.r. Michael
, David C. Joy
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.