Author

Pradeep Lall (Auburn University, Alabama, Usa)

Michael Pecht (University Of Maryland, College Park, Usa)

Edward B. Hakim (U.s. Army Research Laboratory, Ft. Monmouth, Nj)

Presents scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. From a physics-of-failure perspective, this book explores the temperature effects on electrical parameters of both bipolar and MOSFET devices and identifies models for quantifying temperature effects on package elements.

Influence of Temperature on Microelectronics and System Reliability

Author

Pradeep Lall (Auburn University, Alabama, Usa)

Michael Pecht (University Of Maryland, College Park, Usa)

Edward B. Hakim (U.s. Army Research Laboratory, Ft. Monmouth, Nj)

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